Local Gate Height Tuning by Cmp And Dummy Gate Design

ABSTRACT

The present disclosure describes fabricating devices with tunable gate height and effective capacitance. A method includes forming a first metal gate stack in a dummy region of a semiconductor substrate, the first metal gate stack including a first work function metal (WFM) layer; forming a second metal gate stack in an active device region of the semiconductor substrate, the second metal gate stack including a second WFM layer different than the first WFM layer; and performing a CMP process using a slurry including a charged abrasive nanoparticles. The charged abrasive nanoparticles include a first concentration in the active device region different from a second concentration in the dummy region causing different polish rates in the active device region and dummy region. After the performing of the CMP process, the first metal gate stack has a first height greater different from a second height of the second metal gate stack.

BACKGROUND

This application claims priority to U.S. Provisional Patent ApplicationSer. No. 62/955,734 filed Dec. 31, 2019, the entire disclosure of whichis hereby incorporated herein by reference.

The semiconductor integrated circuit (IC) industry has experiencedexponential growth. Technological advances in IC materials and designhave produced generations of ICs where each generation has smaller andmore complex circuits than the previous generation. In the course of ICevolution, functional density (i.e., the number of interconnecteddevices per chip area) has generally increased while geometry size(i.e., the smallest component (or line) that can be created using afabrication process) has decreased. This scaling down process generallyprovides benefits by increasing production efficiency and loweringassociated costs. Such scaling down has also increased the complexity ofprocessing and manufacturing ICs.

For example, high-K metal gates have been implemented to reduce gateleakage current, poly-silicon gate depletion, and other issuesassociated with continued down-scaling. However, methods using cut polyand cut poly CMP cannot offer tuning of gate height. Furthermore, cutpoly CMP is not a final gate height decisive process and any gate heightvariation or loading will impact replacement metal gate process window.After replacement metal gate process, additional process steps canaffect local topography. Methods to provide improved tuning of gateheight in today's ever-smaller devices remains a challenge.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure is best understood from the following detaileddescription when read with the accompanying figures. It is emphasizedthat, in accordance with the standard practice in the industry, variousfeatures are not drawn to scale and are used for illustration purposesonly. In fact, the dimensions of the various features may be arbitrarilyincreased or reduced for clarity of discussion.

FIG. 1 is a flow chart illustrating a method of forming a semiconductorstructure in accordance with some embodiments.

FIGS. 2A, 2B, 2C and 2D are perspective views of the semiconductorstructure at various fabrication stages in accordance with someembodiments.

FIG. 3A is a top view of a semiconductor structure in accordance withsome embodiments.

FIG. 3B is a top view of a semiconductor structure in portion, accordingto various embodiments.

FIG. 4A is a side section view of a semiconductor structure at a stageduring a fabrication process in accordance with some embodiments.

FIG. 4B is a side section view of the semiconductor structure at a stageduring the fabrication process in accordance with some embodiments.

FIG. 4C is a side section view of the semiconductor structure beforeperforming a chemical mechanical polishing (CMP) process illustratingmetal gates in a dummy region including a high ratio of tungsten (W) inaccordance with some embodiments.

FIG. 4D is a side section view of the semiconductor structure of FIG. 4Cafter performing the CMP process using a negatively charged abrasive inaccordance with some embodiments.

FIG. 5 is a flow chart illustrating a method of forming a semiconductorstructure in accordance with some embodiments.

FIG. 6A is a side section view of a semiconductor structure beforeperforming a CMP process illustrating a metal gate in a dummy regionincluding a low ratio of tungsten in accordance with some embodiments.

FIG. 6B is a side section view of the semiconductor structure of FIG. 6Aafter performing the CMP process using a positively charged abrasive inaccordance with some embodiments.

FIG. 7 is a flow chart illustrating a method of forming a semiconductorstructure in accordance with some embodiments.

FIG. 8A is a side section view of a semiconductor structure afterperforming a CMP process using a first combination of slurry type andcut metal gate (CMG) fill material illustrating effect on removal ratein accordance with some embodiments.

FIG. 8B is a side section view of a semiconductor structure afterperforming a CMP process using a second combination of slurry type andCMG fill material illustrating effect on removal rate in accordance withsome embodiments.

FIG. 8C is a diagram illustrating removal rates of various materials fordifferent slurry types in accordance with some embodiments.

FIG. 8D is a diagram illustrating gate height in the dummy region andgate height in the active region for various combinations of CMGdensity, CMG fill, and slurry type in accordance with some embodiments.

FIG. 9 is a flow chart illustrating a method of forming a semiconductorstructure in accordance with some embodiments.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly. Still further, when anumber or a range of numbers is described with “about,” “approximate,”and the like, the term is intended to encompass numbers that are withina reasonable range including the number described, such as within +/−10%of the number described or other values as understood by person skilledin the art. For example, the term “about 5 nm” encompasses the dimensionrange from 4.5 nm to 5.5 nm.

The present disclosure is generally related to semiconductor devices andfabrication methods, and more particularly to fabricating devices withtunable gate height and effective capacitance (C_(eff)). In someimplementations, gate height and C_(eff) have a positive proportionalrelationship, or in other words, decreasing gate height decreasesC_(eff). In some implementations, tuning C_(eff) can provide a localdevice with greater degree of freedom for speed tuning. In someimplementations, gate height tuning can be used for multiple advancedtechnology nodes and is applicable for N5, N3, N2, and beyond. In someimplementations, gate height tuning is applicable to logic and SRAMdevices and all IP blocks. In some implementations, local gate heightmay be tunable during metal gate chemical mechanical polishing (CMP) andcut metal gate (CMG) CMP. In some implementations local gate height maybe tunable by slurry polish rate, abrasive charge, CMG fill material,and environmental dummy gate and cut metal gate design. In someimplementations, CMP slurry polish rates may be tunable for TiN (p-typemetal), W (p-type metal), Al (n-type metal), SiO₂, and SiN (dielectric).In some implementations, interaction of CMG fill material and CMP slurrypolish rate can cause environmental dummy gate effect on active gateheight. In some implementations, interaction of CMP abrasive and CMGfill material based on behavior of positively and negatively chargedabrasive nanoparticles can cause additional environmental dummy gateeffect on active gate height.

FIG. 1 is a flowchart of a method 20 fabricating a semiconductor devicestructure having field-effect transistors (FETs), wherein each of theFETs further includes a gate stack (or simply gate) coupled with thechannel of the corresponding FET. Gate height is a sensitive factor,related to effective capacitance and circuit RC delay. The disclosedmethod provides an effect method for tuning the gate height locally oneither direction (higher or lower) according to the circuit timingconsideration of the integrated circuit.

FIGS. 2A-2D are perspective views of a semiconductor structure 100 atvarious stages during a fabrication process in accordance with someembodiments. The method 20 is described below with reference to FIGS. 1and 2A-2D.

Referring to FIGS. 1 and 2A, the method 20 includes a block 22 byproviding a workpiece (or a semiconductor device structure) 100 having asemiconductor substrate 102. The semiconductor substrate 102 includes afirst region 102A (such as for p-type FETs or PFETs) and a second region102B (such as for n-type FETs or NFETs). The semiconductor substrate 102includes silicon. In some other embodiments, the substrate 102 includesgermanium, silicon germanium or other proper semiconductor materials.The substrate 102 may alternatively be made of some other suitableelementary semiconductor, such as diamond or germanium; a suitablecompound semiconductor, such as silicon carbide, indium arsenide, orindium phosphide; or a suitable alloy semiconductor, such as silicongermanium carbide, gallium arsenic phosphide, or gallium indiumphosphide. The semiconductor substrate 102 may also include variousdoped regions such as n-type doped wells and p-type doped wells. In someembodiments, the semiconductor substrate 102 may include a semiconductoron insulator (SOI) structure formed by a proper technique, such assmart-cut or technology referred to as separation by implanted oxygen(SIMOX).

The semiconductor structure 100 includes various isolation features 104,such as shallow trench isolation (STI) features. The semiconductorstructure 100 also includes various active regions 106, such as finactive regions, formed on the semiconductor substrate 102. The finactive regions 106 are extruded above the isolation features 104 and aresurrounded and isolated from each other by the isolation features 104.Various field effect transistors are formed on the fin active regions106. In some embodiments, PFETs are disposed on the fin active regions106 within the first region 102A and NFETs are disposed on the finactive regions 106 within the second region 102B. In some embodiments,FETs have a vertically stacked channel structure, such asgate-all-around FET structure or other multi-channel structure, such asnanowire or nanosheet structure.

In some embodiments, the STI features 104 are formed by a procedure thatincludes patterning the semiconductor substrate 102 to form trenches;filling the trenches with one or more dielectric material; andperforming a chemical mechanical polishing (CMP) process to remove theexcessive dielectric material and planarize the top surface. Suitablefill dielectric materials include semiconductor oxides, semiconductornitrides, semiconductor oxynitrides, fluorinated silica glass (FSG),low-K dielectric materials, and/or combinations thereof. In variousembodiments, the dielectric material is deposited using a high-densityplasma CVD (HDP-CVD) process, a sub-atmospheric CVD (SACVD) process, ahigh-aspect ratio process (HARP), a flowable CVD (FCVD), and/or aspin-on process.

Still referring to FIGS. 1 and 2A, the method 20 includes an operation24 by forming various dummy gates 110 on the fin active regions 106 andthe STI features 104. In the present embodiment, the dummy gates 110have elongated shapes and are oriented in the Y direction while the finactive regions 106 are oriented in the X direction. Each of the dummygates 110 may be disposed over multiple fin active regions 106.Especially, some dummy gates 110 or portions thereof are formed on thefin active regions 106 and some dummy gates 110 or portions thereof areformed on the STI feature 104. In some embodiments, one or more dummygate is disposed on ends of the fin active regions 106 so that this gateis partially landing on the fin active region 106 and partially landingon the STI feature 104. Those edges are configured to reduce edge effectand improve overall device performance.

In the present embodiment, the dummy gates 110 each may includepolysilicon and may additionally include silicon oxide underlying thepolysilicon. The formation of the dummy gates 110 includes depositingthe gate materials (including polysilicon in the present example); andpatterning the gate materials by a lithographic patterning and etching.A gate hard mask may be formed on the gate materials and is used as anetch mask during the formation of the dummy gates 110. The gate hardmask may include any suitable material with etching selectivity, such assilicon oxide, silicon nitride, silicon carbide, silicon oxynitride,other suitable materials, and/or combinations thereof. In someembodiments, the patterning process to form the dummy gates 110 includesforming a patterned resist layer on the gate hard mask by lithographyprocess; etching the gate hard mask using the patterned resist layer asan etch mask; and etching the gate materials to form the dummy gates 110using the patterned gate hard mask as an etch mask.

One or more gate sidewall features (or spacers) 112 are formed on thesidewalls of the dummy gates 110 and the sidewalls of the fin activeregions 106 as well. The spacers 112 may be used to offset thesubsequently formed source/drain features and may be used forconstraining or modifying the source/drain structure profile. Thespacers 112 may include any suitable dielectric material, such as asemiconductor oxide, a semiconductor nitride, a semiconductor carbide, asemiconductor oxynitride, other suitable dielectric materials, and/orcombinations thereof. The spacers 112 may have multiple films, such astwo films (a silicon oxide film and a silicon nitride film) or threefilms (a silicon oxide film; a silicon nitride film; and a silicon oxidefilm). The formation of the spacers 112 includes deposition andanisotropic etching, such as dry etching. The dummy gates 110 areconfigured in the fin active regions 106 for various field effecttransistors, therefore the corresponding FETs are also referred to asFinFETs. In the present examples, the field effect transistors includep-type FETs within the first region 102A and n-type FETs within thesecond region 102B. In other examples, those field effect transistorsare configured to form a logic circuit, a memory circuit (such as one ormore static random-access memory (SRAM) cells) or other suitablecircuit.

Still referring to FIGS. 1 and 2A, the method 20 proceeds to anoperation 26 by forming various sources and drains (or source/drainfeatures-S/D features) 108 to respective FinFETs. The sources and drains108 may include both light doped drain (LDD) features and heavily dopedsource and drain (S/D). Each field effect transistor includes a sourceand a drain formed on the respective fin active region and interposed bythe dummy gates 110. A channel is formed in the fin active region in aportion that is underlying the dummy gate and spans between the sourceand drain 108.

The raised sources and drains 108 may be formed by selective epitaxialgrowth for strain effect with enhanced carrier mobility and deviceperformance. The dummy gates 110 and the spacers 112 constrain thesources and drains 108 to be selectively grown within the source/drainregions with proper profile. In some embodiments, the sources and drains108 are formed by one or more epitaxial (epi) processes, whereby Sifeatures, SiGe features, SiC features, and/or other suitable featuresare grown in a crystalline state on the fin active regions 106.Alternatively, an etching process is applied to recess the source/drainregions before the epitaxial growth. Suitable epitaxial processesinclude CVD deposition techniques (e.g., vapor-phase epitaxy (VPE)and/or ultra-high vacuum CVD (UHV-CVD), molecular beam epitaxy, and/orother suitable processes. The epitaxial process may use gaseous and/orliquid precursors, which interact with the composition of the finstructure 106. In some embodiments, adjacent sources/drains may be grownto merge together to provide increased contact area and reduce thecontact resistance. This can be achieved by controlling the epitaxialgrowth process.

The sources and drains 108 may be in-situ doped during the epitaxialprocess by introducing doping species including: p-type dopants, such asboron or BF₂; n-type dopants, such as phosphorus or arsenic; and/orother suitable dopants including combinations thereof. If the sourcesand drains 108 are not in-situ doped, an implantation process isperformed to introduce the corresponding dopant into the sources anddrains 108. In an embodiment, the sources and drains 108 in an nFETinclude SiC or Si doped with phosphorous, while those in a pFET includeGe or SiGe doped with boron. In some other embodiments, the raisedsources and drains 108 include more than one semiconductor materiallayers. For example, a silicon germanium layer is epitaxially grown onthe substrate within the source/drain regions and a silicon layer isepitaxially grown on the silicon germanium layer. One or more annealingprocesses may be performed thereafter to activate the sources and drains108. Suitable annealing processes include rapid thermal annealing (RTA),laser annealing processes, other suitable annealing technique or acombination thereof.

Referring to FIGS. 1 and 2B, the method 20 proceeds to an operation 28,in which an ILD layer 116 is formed on the semiconductor substrate 102,covering the sources and drains 108. The ILD layer 116 is drawn withdashed lines in FIG. 2B and is illustrated as transparent to have betterview of other features (such as the fin active regions 106, the dummygates 110, and the sources and drains 108) embedded in the ILD layer116. The ILD layer 116 surrounds the dummy gates 110 allowing the dummygates 110 to be removed and a replacement gate to be formed in theresulting cavity (also referred to as gate trench). Accordingly, in suchembodiments, the dummy gates 110 are removed after the formation of theILD layer 116. The ILD layer 116 is also a part of an electricalinterconnect structure that electrically interconnects various devicesof the semiconductor structure 100. In such embodiments, the ILD layer116 acts as an insulator that supports and isolates the conductivetraces. The ILD layer 116 may include any suitable dielectric material,such as a semiconductor oxide, a semiconductor nitride, a semiconductoroxynitride, other suitable dielectric materials, or combinationsthereof. In some embodiments, the ILD layer 116 includes a low-kdielectric material (with a dielectric constant less than that ofsilicon oxide). The formation of the ILD layer 116 may includedeposition and CMP to provide a planarized top surface.

Referring to FIGS. 1 and 2C in a perspective view, the method 20proceeds to operations for gate replacement, in which the dummy gates110 are removed and replaced by gate stacks 120 with high-k dielectricmaterial and metal, therefore also referred to as high-k metal gatestacks 120. In present embodiment, the gate replacement process mayinclude an operation 30 for etching to remove the dummy gates 110,resulting in gate trenches in the ILD layer 116; an operation 32 fordepositing the gate materials (such as high-K dielectric material, workfunction metal and filling metal) and an operation 34 for polishing byCMP. In the present embodiment, the dummy gates 110 are selectivelyremoved by etching, resulting in gate trenches. Then the gate materials,such as high k dielectric material and metal, are deposited in the gatetrenches to form the high-k metal gate stacks 120. A CMP process isfurther implemented to polish and remove the excessive gate materialsfrom the semiconductor structure 100.

The gate stacks 120 are formed in the gate trenches by a properprocedure, such as a gate-last process or a high-k-last process.Although it is understood that the gate stacks 120 may have any suitablegate structure and may be formed by any suitable procedure. A gate stack120 is formed on the semiconductor substrate 102 overlying the channelof the fin active region 106. The gate stacks 120 include a gatedielectric layer 120A and a gate electrode 120B disposed on the gatedielectric layer 120A. In the present embodiment, the gate dielectriclayer 120A includes a high-k dielectric material and the gate electrode120B includes metal or metal alloy. In some examples, the gatedielectric layer 120A and the gate electrode 120B each may include anumber of sub-layers.

The high-k dielectric material may include metal oxide, metal nitride,such as LaO, AlO, ZrO, TiO, Ta₂O₅, Y₂O₃, SrTiO₃ (STO), BaTiO₃ (BTO),BaZrO, HfZrO, HfLaO, HfSiO, LaSiO, AlSiO, HfTaO, HfTiO, (Ba,Sr)TiO₃(BST), Al₂O₃, Si₃N₄, oxynitrides (SiON), or other suitable dielectricmaterials. The gate dielectric layer 120A may further include aninterfacial layer sandwiched between the high-k dielectric materiallayer and the corresponding fin active region 106. The interfacial layermay include silicon oxide, silicon nitride, silicon oxynitride, and/orother suitable material. The interfacial layer is deposited by asuitable method, such as ALD, CVD, ozone oxidation, etc. The high-kdielectric layer is deposited on the interfacial layer (if theinterfacial layer presents) by a suitable technique, such as ALD, CVD,metal-organic CVD (MOCVD), PVD, thermal oxidation, combinations thereof,and/or other suitable techniques. In some other embodiments, the gatedielectric layer 120A is formed in the high-k last process, in which thegate dielectric layer 120A is deposited in the gate trench at theoperation 32. In this case, the gate dielectric layer 120A is U-shaped.

The gate electrode may include Ti, Ag, Al, TiAlN, TaC, TaCN, TaSiN, Mn,Zr, TiN, TaN, Ru, Mo, Al, WN, Cu, W, Ru, Co, or any suitable conductivematerials. In some embodiments, different metal materials are used fornFET and pFET devices with respective work functions to enhance deviceperformance.

The gate electrode 120B may include multiple conductive materials. Insome embodiments, the gate electrode 120B includes a capping layer, awork function metal layer and a filling metal layer. In furtherance ofthe embodiments, the capping layer includes titanium nitride, tantalumnitride, or other suitable material, formed by a proper depositiontechnique such as ALD. The work functional metal layer includes aconductive layer of metal or metal alloy with proper work function suchthat the corresponding FET is enhanced for its device performance. Thework function (WF) metal layer is different in composition for a pFETand a nFET, respectively referred to as an p-type WF metal and a n-typeWF metal. Particularly, an n-type WF metal is a metal having a firstwork function such that the threshold voltage of the associated nFET isreduced. The n-type WF metal is close to the silicon conduction bandenergy (Ec) or lower work function, presenting easier electron escape.For example, the n-type WF metal has a work function of about 4.2 eV orless. A p-type WF metal is a metal having a second work function suchthat the threshold voltage of the associated pFET is reduced. The p-typeWF metal is close to the silicon valence band energy (Ev) or higher workfunction, presenting strong electron bonding energy to the nuclei. Forexample, the p-type work function metal has a WF of about 5.2 eV orhigher. In some embodiments, the n-type WF metal includes tantalum (Ta).In other embodiments, the n-type WF metal includes titanium aluminum(TiAl), titanium aluminum nitride (TiAlN), or combinations thereof. Inother embodiments, the n-metal include Ta, TiAl, TiAlN, tungsten nitride(WN), or combinations thereof. In some embodiments, the p-type WF metalincludes titanium nitride (TiN) or tantalum nitride (TaN). In otherembodiments, the p-metal include TiN, TaN, tungsten nitride (WN),titanium aluminum (TiAl), or combinations thereof. The work functionmetal is deposited by a suitable technique, such as PVD. The n-type WFmetal or the p-type WF metal may include various metal-based films as astack for optimized device performance and processing compatibility. Invarious embodiments, the filling metal layer includes tungsten, copperor other suitable metal. The filling metal layer is deposited by asuitable technique, such as PVD or plating.

Referring to FIGS. 1 and 2D, the method 20 proceeds to an operation 36by forming cut-metal gate (CMG or gate-cut features) 122. The gate-cutfeatures 122 are dielectric features that separate long gate stacks 120into short gate stacks. This is used to form gate stacks 120 in doublepatterning or multiple patterning process to enhance patterningresolution and reduce line-end roughness. In this case, a long gatestack is formed in a first patterning process and then is cut into shortgates in a second patterning process such that the gate ends have bettershape and desired dimensions. In the present embodiment, the gate-cutfeatures 122 are formed by patterning process to form trenches anddeposition to fill in the trenches with one or more dielectric material.The patterning process includes lithography process and etching processand may use hard mask to define the regions for the cut-metal gatefeatures. The etching process may include wet etch, dry etch, or acombination thereof to etch through the conductive materials of themetal gate stacks 120. The etching process may use one or more etchant.

Still referring to FIGS. 1 and 2D, the method 20 proceeds to anoperation 38 by performing a CMP process to the gate-cut features 122 toremove the excessive materials of the gate-cut features 122 deposited onthe ILD layer 116 and the metal gate stacks 120, and planarize the topsurface of the semiconductor device structure 100. By the operation 36to form the gate-cut features 122 after the formation of the metal gatestacks 120, the final gate heights of the metal gate stacks 120 are moresensitive to the CMP process at the operation 38 because it is directlyapplied to the metal gate stacks 120. Therefore, the method 20 providesmore leverage to tune gate height. The method 20 may further includeother fabrication operations before, during and after the operationsdescribed above. For examples, the method includes various operations toform interconnect structure to couple various devices, including FETs,into a functional circuit.

As noted above, the gate height is a sensitive factor contributing tothe effective capacitance and RC delay. In the disclosed method 20, thecut-gate process is applied to the metal gate stacks 120 instead of thedummy gate stacks 110. In this case, there are two CMP processes afterthe metal gate stacks 120: first CMP process at operation 34 and secondCMP process at operation 38. Both CMP processes are relevant to the gateheight since both are applied to the metal gate stacks 120, whichprovides more freedom to tune gate height according to the circuitperformance, especially the circuit timing. In each CMP process, thedisclosed method 20 further includes multiple measures to tune the gateheight, especially, by tuning dummy region design 40 and tuning CMPslurry 42. The method 20 is further described with reference to variousfigures according to some embodiments.

The semiconductor structure 100 includes some active device regions andsome dummy regions. An active device region refers to a region havingfunctional FETs and corresponding metal gate stacks 120 formed therein.A dummy region refers to a region having metal gate stacks 120 disposedthereon for fabrication consideration but not configured to function asgates to FETs. For example, those metal gate stacks may be formed on theSTI features and may be additionally or alternatively not electricallyconnected to the circuit, so not functioning as gates to FETs. Incontrast, the metal gate stacks 120 disposed in the active deviceregions are electrically connected and functional to the correspondingFETs. In the present embodiment, an active device region is surroundedby a dummy region. In the disclosed method 20, the metal gate stacks 120formed in the dummy regions can be designed with different densities,different dimensions, different materials (such as different workfunction metals) or a combination thereof to tune local CMP polish raterelative to the metal gate stacks in the active device regions. Becausethe metal gate stacks in the dummy regions are non-functional gates,this provide more room to tune these parameters for fabricationconsideration instead of the transistor consideration. Accordingly, themethod includes an operation 44 by tuning pattern densities of the metalgate stacks in the dummy regions; an operation 46 by tuning dimensionsof the metal gate stacks in the dummy regions; an operation 48 by tuninggate materials (compositions) and duty ratio of the metal gate stacks inthe dummy regions; and an operation 50 by tuning materials(compositions) and dimensions of the gate-cut features in the dummyregions. More particularly, the metal gate stacks 120 in the dummyregions and the gate-cut features may use different materials or havedifferent volume percentages of each gate materials or gate-cutmaterials. Those gate materials (or gate-cut materials) have differentpolish rates, such as tungsten and titanium nitride have differenthardness and therefore different polish rates. Accordingly, overallpolish rate to those metal gate stacks 120 in the dummy regions or tothe gate-cut features would be different from that of the metal gatestacks 120 in the active device regions. For examples, assume thecircuit has n different devices with different threshold voltages, inwhich n may be 2, 3, 4, 5, 6, or other integer, the work function metalsused in the metal gate stacks 120 may have n scenarios of work functionmetals in the dummy regions to tune respective gate heights accordingly.

As to tuning the CMP slurry, the first CMP process at operation 34 andthe second CMP process at operation 38 experience different polishsurfaces. Accordingly, the method 20 includes an operation 42 to tunethe CMP slurry accordingly to the polish surface for each CMP process.Especially, the method 20 includes an operation 52 to tune the CMPabrasive (abrasive nanoparticles) of the CMP slurry according to thepolish surface; and an operation 54 to tune the chemicals of the CMPslurry according to the polish surface. For examples associated with theoperation 52, the abrasive nanoparticles, such as zirconium oxide (ZrO)or zirconium nitride (ZrN), are negatively charged and repel tungsten,causing the polish rate to tungsten lower. In the opposite examples, theabrasive nanoparticles are positively charged and attract tungsten,causing the polish rate to tungsten higher. By choosing charge type ofthe abrasive nanoparticles, the polish rates to different materials aredifferentiated and accordingly can be tuned differently among the dummyregions and the active device regions. In other examples associated withthe operation 54, the CMP slurry can be chosen differently to enhancethe polish rate of the dielectric materials or alternatively enhance thepolish rate of the metal materials, such as a slurry utilizing achemical for removing dielectric material or metal. When the metal gatestacks 120 in the dummy regions are designed with different duty ratioof the metals and dielectric materials (such as by gate pattern densityand gate dimensions), the gate heights in different regions can be tunedaccordingly.

The method 20 is effective to tune gate height according to the circuitof the semiconductor device structure 100, especially for the circuitshaving multiple threshold voltages. The method 20 is further describedbelow with different embodiments.

FIG. 3A is a top view of a semiconductor device structure 100 toillustrate circuit layout according to some embodiments. Thesemiconductor device structure 100 includes dummy regions 130 (such as130A-130F) and active device regions 132 (such as 132A-132F) surroundedby the dummy regions 130, respectively. In some embodiments, thecircuits in different active device regions 132 may have devices (suchas FETs) designed with different threshold voltages, therefore differentdevice structures, such as different thicknesses of the gate dielectriclayer. In some examples, those active device regions 132A-132F each mayhave respective circuit with FETs with a respective threshold voltagedifferent from those in other circuits. In some embodiments wherein onecircuit or a subset of circuits of the semiconductor device structure100 is expected to have greater heights of the gate stacks 120 in thecorresponding FETs, the gate stacks 120 in the dummy region surroundingthe active device region are designed to have a greater metal volumeratio than that of the gate stacks 120 in the active device region; andthe CMP slurry is designed to have positively charged particles, thusthe gate stacks 120 in the dummy region will be polished with a greaterpolish rate than that of the gate stacks 120 in the active deviceregion, resulting in the gate stacks 120 in the active device regionwith a greater height. In some embodiments wherein one circuit or asubset of circuits of the semiconductor device structure 100 is expectedto have greater heights of the gate stacks 120 in the correspondingFETs, the gate stacks 120 in the dummy region surrounding the activedevice region are designed to have a greater dielectric volume ratiothan that of the gate stacks 120 in the active device region; and theCMP slurry is designed to have negatively charged particles, thus thegate stacks 120 in the dummy region will be polished with a greaterpolish rate than that of the gate stacks 120 in the active deviceregion, resulting in the gate stacks 120 in the active device regionwith a greater height.

In some embodiments wherein one circuit or a subset of circuits of thesemiconductor device structure 100 is expected to have less heights ofthe gate stacks 120 in the corresponding FETs, the gate stacks 120 inthe dummy region surrounding the active device region are designed tohave a greater dielectric volume ratio than that of the gate stacks 120in the active device region; and the CMP slurry is designed to havepositively charged particles, thus the gate stacks 120 in the activedevice region will be polished with a greater polish rate than that ofthe gate stacks 120 in the dummy region, resulting in the gate stacks120 in the active device region with a less height. In some embodimentswherein one circuit or a subset of circuits of the semiconductor devicestructure 100 is expected to have less heights of the gate stacks 120 inthe corresponding FETs, the gate stacks 120 in the dummy regionsurrounding the active device region are designed to have a greatermetal volume ratio than that of the gate stacks 120 in the active deviceregion; and the CMP slurry is designed to have negatively chargedparticles, thus the gate stacks 120 in the active device region will bepolished with a greater polish rate than that of the gate stacks 120 inthe dummy region, resulting in the gate stacks 120 in the active deviceregion with a less height. The gate-cut features 122 can be designedsimilarly for its compositions to either increase or decrease the gateheight in the active device region.

FIG. 3B is a top view of a semiconductor device structure 100 in portionto illustrate circuit layout, shape and size according to variousembodiments. The semiconductor device structure 100 includes dummyregions 130 and active device regions 132 surrounded by the dummy region130. The gate stacks 120 are formed on both the dummy region 130 and theactive device region 132. The gate stacks 120 in the dummy region 130are used to tune the gate height of the gate stacks in the active deviceregion 132. However, the gate stacks in the active device region 132 arenot evenly impacted by the gate stacks 120 in the dummy region 130during a CMP process. Particularly, a subset of the gate stacks in theactive device region 132 are strongly impacted during a CMP process whenthose are closer to the gate stacks 120 in the dummy region 130. Asubset of gate stacks in the active device region 132 is weakly impactedduring a CMP process when those are far away from the gate stacks 120 inthe dummy region 130. Accordingly, the shape and size of dummy region130, and the pattern density and dimensions (or collectively duty ratio)of the gate stacks 120 in the dummy region 130 are designed to provideuniform impact to the gate stacks 120 in the active device region 132.Various scenarios in FIG. 3B are constructed according to variousembodiments.

In a first embodiment (A), the gate stacks 120 are not shown for thesake of simplicity. The active device region 132 is a rectangle. Sincethe corner areas (circled in dashed line) receive impact in both sidesfrom the dummy region 130, therefore the impact is stronger andaccordingly the dummy region 130 is shrunken back at corners to have asubstantial rectangle shape but with round corners such that the impactto the active device region 132 from the dummy region 130 is uniformthroughout the active device region 132.

In a second embodiment (B), the active device region 132 has anirregular geometry, such as L-shaped. Since the tip area (circled indashed line) is narrower and receives more impact in three edges fromthe dummy region 130, therefore the dummy region 130 is shrunken back tohave a less dimension. Particularly, the dummy region 130 has adimension D1 at the tip area less than a dimension D2 at other regions.In some embodiments, the ratio D2/D1 ranges between 1.4 and 2.

In a third embodiment (C), the active device region 132 has a rectangleshape. The dummy region 130 has a shape similar to the shape in scenario(A) for the same reason. The gate stacks 120 in the dummy region 130 hasuniform pattern density and gate dimensions (such as gate width).Collectively, the gate stacks 120 has a uniform duty ratio in the dummyregion 130. The duty ratio of the gate stacks 120 is defined Sg/S,wherein S is an area concerned (such as the dummy region 130) and Sg isoccupied areas by the gate stacks 120 in the area. because the dummyregion 130 is shaped and sized to provide uniform impact to the gatestacks 120 (not shown) in the active device region 132, the gate stacks120 in the dummy region 130 can have uniform pattern density and gatedimensions while maintaining the uniform impact to the gate stacks 120in the active device region 132 by the gate stacks 120 in the dummyregion 130.

In a fourth embodiment (D), the active device region 132 is T-shaped.Since the tip area (circled in dashed line) is narrower and receivesimpact in three edges from the dummy region 130 compared to the mainarea (rectangle portion on the right in the active device region 132),therefore the impact to the active device 132 from dummy region 130 isnonuniform. shrunken back at corners to have a substantial rectangleshape but with round corners. Instead of tuning the shape and size ofthe dummy region 130, the gate stacks 120 are tuned with differentpattern density (or gate-to-gate pitch) and gate dimensions to achieveuniform gate height of the gate stacks 120 (not shown) in the activedevice region 132. Particularly, the gate stacks 120 include two groups:the gate stacks 120A associated with the tip area and the gate stacks120B associated with the main area. The gate stacks 120A have a firstpitch P_(A) and a first width W_(A), and the gate stacks 120A have asecond pitch P_(A) and a second width W_(A) less than the first pitchP_(A) and the first width W_(A), respectively. For example, the ratioW_(B)/W_(A) ranges between 1.2 and 1.8, and the ratio P_(B)/P_(A) rangesbetween 1.2 and 1.8, By constructing the gate stacks 120A and 120B withrespective gate pitches and gate widths, the gate height of the gatestacks 120 in the active device region 132 can be uniformly tuned duringthe CMP process.

In a second embodiment (E), the active device region 132 has anirregular geometry, such as L-shaped. Since the tip area (circled indashed line) is narrower and receives more impact in three edges fromthe dummy region 130, the shape and size of the dummy region 130 and thegate pitch and gate width of the gate stacks 120 in the dummy region 130are collectively tuned to achieve uniform gate height of the gate stacks120 in the active device region 132. the shape and size of the dummyregion 130 are tuned in a way similar to those in the scenario (B) andthe gate pitch and gate width of the gate stacks 120 in the dummy region130 are tuned in a way similar to those in the scenario (D).

FIGS. 4A-4D are side sectional view of the semiconductor devicestructure 100, may be taken along the dashed line AA′ of FIG. 3, atvarious stages during a fabrication process in accordance with someembodiments. The method 20 and the semiconductor device structure 100are collectively described with reference to FIGS. 3 and 4A-4D with moredetails on the two CMP processes during the operations 34 and 38.

Referring to FIG. 4A, the semiconductor device structure 100 may includeactive device regions (“A’) and dummy regions (“D”). The semiconductordevice structure 100 includes a semiconductor substrate 102 with variousdevices (such as FETs), isolation features, doped wells, or acombination thereof formed thereon. For examples, the semiconductorsubstrate 102 may include various S/D features, isolation structures,fin other suitable layers, or combinations thereof. In some embodiments,one or more dummy polysilicon gates 110 may be formed on thesemiconductor substrate 104, such as formed on the fin active regions106. In some embodiments, the dummy polysilicon gates 110 may be formedby depositing a polysilicon material on the semiconductor substrate 104followed by patterning and etching the polysilicon material to form thegates 110. After the gates 110 are formed, gate spacers 112 are formedon the sidewalls of the gates 110 by deposition and anisotropic etch.The semiconductor device structure 100 further includes the ILD layer116 formed by deposition and a CMP process or other suitable technique.The metal gate stacks 120 are formed by a gate replacement processincluding various operations.

Referring to FIG. 4B, the metal gate stacks 120 are remove by theoperation 30 that includes etch, resulting in gate trenches 142 in theILD layer 116.

Referring to FIG. 4C, the metal gate stacks 120 are formed in the gatetrenches 142 by the operation 32 that includes depositing various gatematerials, such as high-k dielectric material, one or more liners orcapping layers, work function metal and filling metal. The gatematerials not only deposited in the gate trenches 142 and may alsodeposited on the ILD layer 116.

Still referring to FIG. 4C, the CMP process at the operation 34 isapplied to remove the excessive the gate materials on the ILD layer 116and planarize the top surface of the semiconductor device structure 100as well. In the present embodiment, the metal gate stacks 120 in thedummy region D includes a high ratio of tungsten (W) in accordance withsome embodiments. In furtherance of the embodiment, the filling metal istungsten; the work function metal includes titanium nitride (TiN),titanium aluminum nitride (TiAlN), a combination thereof; the gatedielectric layer 120A includes a silicon oxide layer and high-Kdielectric material layer.

The work function metal layer 144 in the dummy regions D may includeless work function metals than those of the work function metal layer146 in the active device regions A, which means more tungsten in themetal gate stacks 120 in the dummy regions D than that in the activedevice regions A.

As noted above, the gate materials (such as work functional metals) forthe metal gate stacks in the dummy regions are tunable for desired gateheights of the metal gate stacks 120 in the active device regions.Various material compositions of the metal gate stack 120 in the dummyregions D of FIG. 4C are provided below in accordance with someembodiments. The gate materials used in the metal gate stacks 120 in thedummy regions include silicon oxide (“SiO”) as an interfacial layer; ahigh-k dielectric material layer (“High-K”); silicon nitride (“SiN”) asa capping layer; TiN and TiAlN (“TiN” and “TiAlN”) as work functionmetals; and tungsten as filling metal (“W”). The material compositionsare presented in volume percentage (%). The total gate volume is 100%.In 3 scenarios, the metal gate stacks 120 in the dummy regions D haveless volume of work function metals, and higher W volume percentagesthan those in the active device regions A. Particularly, in scenario 1,the gate materials include 5%˜7% High-K; 0%˜2% TiN; 6%˜8% TiAlN; 18%˜22%W; 18%˜22 SiN and 44%˜50% SiO. In scenario 2, the gate materials include5%˜7% High-K; 4%˜6% TiN; 6%˜8% TiAlN; 14%˜16% W; 18%˜22 SiN and 44%˜50%SiO. In scenario 3, the gate materials include 5%˜7% High-K; 9%˜11% TiN;6%˜8% TiAlN; 9%˜11% W; 18%˜22 SiN and 44%˜50% SiO.

The slurry of the CMP process includes negatively charged abrasivenanoparticles 148, which are repelled from tungsten, leading to morenegatively charged abrasive nanoparticles 148 distributed in the activedevice regions A that have less tungsten ratio. Thus, during the CMPprocess 64, due to negatively charged abrasive nanoparticles and highertungsten ratio in the dummy regions, the CMP polish rate in the activedevice regions A is greater than the polish rate in the dummy regions D.Accordingly, the gate height of the metal gate stacks 120 in the activedevice regions A is less, such as 1˜3 nm less, than those in the dummyregions D, as illustrated in FIG. 4D. The charge type of the abrasiveparticles can be tuned by tuning the pH value of the correspondingslurry. For abrasive particles of a given composition, there exists is apH value wherein the number of negative group and positive group areequal. This pH value is referred to as a point of zero charge (pzc) toabrasive particles of the given material. When the pH is at pzc,abrasive particles show zero zeta potential and balanced charges. Whenthe pH value is different from the pzc, the abrasive particles arecharged negatively or positively. For examples, SiO₂ shows negativecharge at about pH (pzc) 3. Here pH (pzc) 3 is a relative pH value withpzc as reference. SiO₂ charge is slightly decreased with an increase inpH above pH 9, which is attributed to the compression of the electricaldouble layer. Si₃N₄ shows a negative above pH(pzc) 6.5 by formation ofSiO.

The same CMP process may also be implemented in the operation 38 for theCMP process after the gate-cut features are formed. This method isfurther summarized in the flowchart illustrated in FIG. 5. In thismethod 70, tungsten is used as filling metal (72); negatively chargedabrasive nanoparticles 148 are used in the CMP slurry (74); and the workfunction metal layer 144 of the metal gate stacks 120 in the dummyregions D have lower volume percentages than that of the work functionmetal layer 146 in the active device regions A (76). By applying themethod 70 to the CMP process at the operation 34, the CMP process at theoperation 38, or both, the gate height of the metal gate stacks 120 inthe active device regions A may be reduced by few nanometers than thosein the dummy regions. This can reduce the effective capacitance (GO inthe active device regions A by about 1% or more. In some otherembodiments, W, TiN, Al, TaN, TiSiN, or a combination thereof may beused as filling metal, depending on metal gates on active device regionsor dummy regions, and desired gate height tuning effect.

Another embodiment of a method 80 to tune the gate heights withdifferent CMP processing scenarios is illustrated in FIGS. 6A-6Cconstructed in accordance with some embodiments. Referring to FIG. 6A,the CMP process at the operation 34 is applied to remove the excessivegate materials on the ILD layer 116 and planarize the top surface of thesemiconductor device structure 100 as well. In the present embodiment,the metal gate stacks 120 in the dummy region D includes a low ratio oftungsten in accordance with some embodiments. In furtherance of theembodiment, the filling metal is tungsten; the work function metalincludes TiN, TiAlN, or a combination thereof; the gate dielectric layer120A includes a silicon oxide layer and high-K dielectric materiallayer.

The work function metal layer 144 in the dummy regions D include morework function metals than those of the work function metal layer 146 inthe active device regions A, which means less tungsten in the metal gatestacks 120 in the dummy regions D than that in the active device regionsA. Various material compositions of the metal gate stack 120 in thedummy regions D of FIG. 6A are provided below in accordance with someembodiments. The gate materials used in the metal gate stacks 120 in thedummy regions include silicon oxide (“SiO”) as an interfacial layer; ahigh-k dielectric material layer (“High-K”); silicon nitride (“SiN”) asa capping layer; TiN and TiAlN (“TiN” and “TiAlN”) as work functionmetals; and tungsten as filling metal (“W”). The material compositionsare presented in volume percentage (%). The total gate volume is 100%.In 3 scenarios, the metal gate stacks 120 in the dummy regions D havehigher volume of work function metals, and higher W volume percentagesthan those in the active device regions A. Particularly, in scenario 1,the gate materials include 5%˜7% High-K; 13%˜17% TiN; 6%˜8% TiAlN; 4%˜6%W; 18%˜22 SiN and 44%˜50% SiO. In scenario 2, the gate materials include5%˜7% High-K; 16%˜20% TiN; 6%˜8% TiAlN; 1%˜3% W; 18%˜22 SiN and 44%˜50%SiO. In scenario 3, the gate materials include 5%˜7% High-K; 18%˜22%TiN; 6%˜8% TiAlN; 0%˜2% W; 18%˜22 SiN and 44%˜50% SiO.

The slurry of the CMP process includes negatively charged abrasivenanoparticles 150, which are repelled from to tungsten, leading to morenegatively charged abrasive nanoparticles 150 distributed in the dummyregions D with lower tungsten ratio. Thus, during the CMP process 34,due to negatively charged abrasive nanoparticles and lower tungstenratio in the dummy regions, the CMP polish rate in the dummy regions Dis greater than the polish rate in the active device regions A.Accordingly, the gate height of the metal gate stacks 120 in the activedevice regions A is greater, such as 1˜3 nm greater, than those in thedummy regions D, as illustrated in FIG. 6B.

The same CMP process may also be implemented in the operation 38 for theCMP process after the gate-cut features are formed. This method 80 isfurther summarized in the flowchart illustrated in FIG. 7. In thismethod 80, tungsten is used as filling metal (72); positively chargedabrasive nanoparticles 150 are used in the CMP slurry (82); and the workfunction metal layer 144 of the metal gate stacks 120 in the dummyregions D have higher volume percentages than that of the work functionmetal layer 146 in the active device regions A (84). By applying themethod 80 to the CMP process at the operation 34, the CMP process at theoperation 38, or both, the gate height of the metal gate stacks 120 inthe active device regions A may be reduced by few nanometers than thosein the dummy regions. This can reduce the effective capacitance(C_(eff)) in the active device regions A by about 1% or more.

Another embodiment of a method 90 to tune the gate heights withdifferent CMP processing scenarios is illustrated in FIGS. 8A-8Dconstructed in accordance with some embodiments. Referring to FIG. 8A,the CMP process at the operation 38 is applied to remove the excessivedielectric materials of the gate-cut features 122 deposited on the ILDlayer 116 and planarize the top surface of the semiconductor devicestructure 100 as well. In the present embodiment, the CMP process at theoperation 38 is tuned by the method 900 illustrated in FIG. 9. Themethod 90 includes using different compositions for the gate-cutfeatures 122 in the dummy regions D; using different pattern density tothe gate-cut features 122 in the dummy regions D; and choosing a CMPslurry according to the composition of the gate-cut features 122 in thedummy regions D. This is further explained with one example. For theoperation 92, the gate-cut features 122 use two dielectric materials:silicon oxide (SiO₂), silicon nitride (SiN) or a combination thereof.However, the gate-cut features 122 within the dummy regions D choose thedielectric materials differently from those in the gate-cut features 122in the active device regions A, such as the dummy regions D choosing oneof SiO₂ and SiN, and the active device regions A choosing another, orvise verse. Alternatively, both dummy regions D and the active deviceregions A chose SiO₂ and SiN but with different volume ratio. As to theoperation 94, the pattern density of the gate-cut features 122 is tunedeither higher or lower. As to the operation 96, the CMP process ischosen between two type CMP slurries, one having a higher polish rate toSiO₂ and another having a higher polish rate to SiN. By applying threefactors (92, 94 and 96), the gate height of the metal gate stacks 120 inthe active device regions A can be tuned either higher or loweraccording to the desired gate height to fit the circuit requirement.

FIG. 8C provides a diagram illustrating polishing removal rates of twoCMP slurries (Slurry 1 and Slurry 2) over various gate materials basedon the experiments. The diagram is includes a vertical axis representingthe polishing removal rate (angstrom per minute or A/min) and ahorizontal axis representing four exemplary gate materials to bepolished: A, B, C and D. According to some embodiments, A is a fillingmetal W; filling metal W; and B and C are two dielectric materials forthe gate-cut features 122, such as SiN and SiO₂, respectively; and D isa work function metal TiN.

In some embodiments, each of the slurry 1 and slurry 2 includes strongoxidizing agent, such as hydrogen peroxide (H₂O₂) and iron nitrate(FeNO₃), KOH, NH₄OH, HNO₃ or a combination thereof; and abrasivenanoparticles, such as silica SiO₂, alumina Al₂O₃, CeO₂, ZrO₂, or acombination thereof. Furthermore, the abrasive particles in the slurries1 and 2 may include negatively charged abrasive particles, such as NH₄OHand silica SiO₂ created negative —OH group; and positively chargedabrasive particles, such as cetrimonium bromide (CTAB) surfactant andsilica SiO₂. However, the slurries 1 and 2 are respectively tuned withdifferent compositions and concentrations to have desired polish ratesto various materials. From the diagram, the experiments indicate thatthe slurry 1 and slurry 2 have different polishing rates to variousmaterials to be polished. Particularly, slurries 1 and 2 show polishingeffects to materials A, B and D (also referred to as first typematerials) different from that to material C (also referred to as secondtype materials). In this example, when the slurry 1 is switched toslurry 2, the polishing removal rates to the first type materials (suchas materials A, B and D) are increased while the polishing removal ratesto the second type materials (such as material C) is decreased. Thus,the diagram from the corresponding experiment data provides a guidelinefor gate height tuning. For example, when the slurry 1 is used and thegate height of the metal gate stacks 120 in the active device regions isdesired to be greater, the metal gate stacks 120 in the dummy regionsare formed with more of the second type materials (especially material Ddue to substantial increase in the polishing removal rate) to increasethe polishing removal rate to the metal gate stacks 120 in the dummyregions so that the metal gate stacks in the active device regions havea lower polishing removal rate and a relative greater height. In anotherexample where the slurry 1 is used and the gate height of the metal gatestacks 120 in the active device regions is desired to be less, the metalgate stacks 120 in the dummy regions are formed with more of the firsttype materials to decrease the polishing removal rate to the gates inthe dummy regions so that the metal gate stacks 120 in the active deviceregions have a greater polishing removal rate and a relative lessheight. In yet another example where the slurry 2 is used and the gateheight of the metal gate stacks 120 in the active device regions isdesired to be less, the metal gate stacks 120 in the dummy regions areformed with more of the second type materials to decrease the polishingremoval rate to the metal gate stacks 120 in the dummy regions so thatthe metal gate stacks 120 in the active device regions have a greaterpolishing removal rate and a relative less height. In another examplewhere the slurry 2 is used and the gate height of the metal gate stacks120 in the active device regions is desired to be greater, the metalgate stacks 120 in the dummy regions are formed with more of the firsttype materials to increase the polishing removal rate to the metal gatestacks 120 in the dummy regions so that the metal gate stacks 120 in theactive device regions have a less polishing removal rate and a relativegreater height. In other examples, silicon nitride is usually positivelycharged and attracts negatively charged abrasive particles. Accordingly,the slurry 2 is designed with a higher concentration of the negativelycharged abrasive particles than that of the slurry 1, and therefore hasa higher polish rate to silicon nitride. Generally, the polish rate toeach respective material to be polished is determined by a combinationof all above slurry compositions, various compositions andconcentrations of the slurries 1 and 2 can be designed to provide apolish matrix according to FIG. 8C for proper tuning gate heights.

As described previously, the gate materials for both the gate-cutfeatures 122 and the metal gate stacks 120 in the dummy regions have thefreedom to be tuned for favorable gate heights. FIG. 8D is a diagramrepresenting 5 scenarios 1, 2, 3, 4 and 5, each with respective densityof the gate-cut features 122 (“CMG Density”) in the dummy regions;compositions of the gate-cut features 122 (“CMG Fill”); and slurry (“CMGCMP Slurry”), as labeled in the horizontal axis. The scenario 1 has lowCMG density, the composition of the gate-cut features 122 as either B(such as SiN) or C (such as SiO), and slurry 1 or 2; the scenario 2 hashigh CMG density, the composition of the gate-cut features 122 as B(such as SiN), and slurry 2; the scenario 3 has high CMG density, thecomposition of the gate-cut features 122 as B (such as SiN), and slurry1; the scenario 4 has high CMG density, the composition of the gate-cutfeatures 122 as C (such as SiO), and slurry 2; and the scenario 5 hashigh CMG density, the composition of the gate-cut features 122 as C(such as SiO), and slurry 1. The gate height results (decreased “−”, orincreased “+”) in the dummy regions D (“Dummy GH”) and the relative gateheight results in the active device regions A (“Active GH”) arerespectively represented in the vertical axis. For example, in thescenario 3, the gate height of the metal gate stacks 120 in the dummyregions D is increased 3 nm and the gate height of the metal gate stacks120 in the active device regions A is increased 2 nm. From the diagram,the scenarios 3 and 4, the gate height of the metal gate stacks 120 inthe active device regions A is relatively less than the gate height ofthe metal gate stacks 120 in the dummy regions D, and therefore can beutilized when the gate height of the metal gate stacks 120 in the activedevice regions A is desired to be greater. the scenarios 2 and 5, thegate height of the metal gate stacks 120 in the active device regions Ais relatively greater than the gate height of the metal gate stacks 120in the dummy regions D, and therefore can be utilized when the gateheight of the metal gate stacks 120 in the active device regions A isdesired to be less.

FIG. 8B illustrates one exemplary results of the gate heights in thedummy regions D and the active device regions A associated with thescenario B after the CMP process at the operation 38.

In various embodiments, the methods 70, 80 and 90 may be combined togenerate the desired gate heights among the dummy and active deviceregions. For example, the methods 70 and 90 are combined. Not only theabrasive nanoparticles is chosen to be negatively charged (74) and thevolume percentage of the work function metal in the dummy regions D istuned to be lower (78) but also the metal gate stacks 120 in the dummyregions D are tuned to have different composition (92), differentpattern density (94) and the CMP slurry is also chosen among the two CMPslurries (96) to tune the gate height of the metal gate stacks 120 inthe active device regions A. Similarly, the methods 70 and 90 may becombined to tune the gate height of the metal gate stacks 120 in theactive device regions A.

The present disclosure provides a method to fabricate field-effecttransistors with more freedom and approaches to tune the gate heightaccording to the circuit design consideration, such as effectivecapacitance and time delay, to enhance the circuit performance. Themethod includes tuning the gate stacks in the dummy regions for itscomposition and pattern density, and further tuning the CMP slurry forits chemicals and abrasive nanoparticles including charging, geometryand dimension.

In one aspect, the present disclosure describes fabricating devices withtunable gate height and effective capacitance. A method includes forminga first metal gate stack in a dummy region of a semiconductor substrate,the first metal gate stack including a first work function metal (WFM)layer; forming a second metal gate stack in an active device region ofthe semiconductor substrate, the second metal gate stack including asecond WFM layer different than the first WFM layer; and performing aCMP process using a slurry including a charged abrasive nanoparticles.The charged abrasive nanoparticles include a first concentration in theactive device region different from a second concentration in the dummyregion causing different polish rates in the active device region anddummy region. After the performing of the CMP process, the first metalgate stack has a first height greater different from a second height ofthe second metal gate stack.

In another aspect, the present disclosure provides a method thatincludes providing a semiconductor substrate; forming a first metal gatestack in a dummy region of the semiconductor substrate, the first metalgate stack including a first work function metal layer; forming a secondmetal gate stack in an active device region of the semiconductorsubstrate, the second metal gate stack including a second work functionmetal layer different than the first work function metal layer; andperforming a chemical mechanical polishing (CMP) process using a slurryincluding a negatively charged abrasive nanoparticles, wherein thenegatively charged abrasive nanoparticles includes a higherconcentration in the active device region than in the dummy regioncausing a faster removal rate in the active device region, and whereinafter the performing of the CMP process, the first metal gate stack hasa first height greater than a second height of the second metal gatestack.

In yet another aspect, the present disclosure provides a method thatincludes providing a semiconductor substrate; forming a first metal gatestack in a dummy region of the semiconductor substrate and a firstsecond metal gate stack in an active device region of the semiconductorsubstrate; forming first cut metal gates (CMGs) in the dummy region;forming second CMGs in the active device region, wherein the second CMGsare different from the first CMGs in composition; and performing achemical mechanical polishing (CMP) process using a slurry, whereinafter the performing of the CMP process, the first metal gate stack hasa first height different from a second height of the second metal gatestack.

The foregoing outlines features of several embodiments so that those ofordinary skill in the art may better understand the aspects of thepresent disclosure. Those of ordinary skill in the art should appreciatethat they may readily use the present disclosure as a basis fordesigning or modifying other processes and structures for carrying outthe same purposes and/or achieving the same advantages of theembodiments introduced herein. Those of ordinary skill in the art shouldalso realize that such equivalent constructions do not depart from thespirit and scope of the present disclosure, and that they may makevarious changes, substitutions, and alterations herein without departingfrom the spirit and scope of the present disclosure.

What is claimed is:
 1. A method, comprising: providing a semiconductorsubstrate; forming a first metal gate stack in a dummy region of thesemiconductor substrate, the first metal gate stack including a firstwork function metal layer; forming a second metal gate stack in anactive device region of the semiconductor substrate, the second metalgate stack including a second work function metal layer different thanthe first work function metal layer; and performing a chemicalmechanical polishing (CMP) process using a slurry including a chargedabrasive nanoparticles, wherein the charged abrasive nanoparticlesinclude a first concentration in the active device region different froma second concentration in the dummy region causing different polishrates in the active device region and dummy region, and wherein afterthe performing of the CMP process, the first metal gate stack has afirst height greater different from a second height of the second metalgate stack.
 2. The method of claim 1, wherein the performing of the CMPprocess includes using a slurry including a negatively charged abrasive,wherein the negatively charged abrasive includes a higher concentrationin the active device region than in the dummy region causing a fasterremoval rate in the active device region, and wherein after theperforming of the CMP process, the first metal gate stack has a firstheight greater than a second height of the second metal gate stack. 3.The method of claim 2, wherein each of the first and second metal gatestacks includes tungsten as a filling metal; the first work functionmetal layer of the first metal gate stack includes titanium nitride witha first volume percentage; and the second work function metal layer ofthe second metal gate stack includes titanium nitride with a secondvolume percentage greater than the first volume percentage.
 4. Themethod of claim 3, wherein the first height of the first metal gatestack is greater than the second height of the second metal gate stack.5. The method of claim 1, wherein the performing of the CMP processincludes using a slurry including a positively charged abrasive, whereinthe positively charged abrasive includes a lower concentration in theactive device region than in the dummy region causing a slower removalrate in the active device region, and wherein after the performing ofthe CMP process, the first metal gate stack has a first height less thana second height of the second metal gate stack.
 6. The method of claim5, wherein each of the first and second metal gate stacks includestungsten as a filling metal; the first work function metal layer of thefirst metal gate stack includes titanium nitride with a first volumepercentage; and the second work function metal layer of the second metalgate stack includes titanium nitride with a second volume percentageless than the first volume percentage.
 7. The method of claim 6, whereinthe first height of the first metal gate stack is less than the secondheight of the second metal gate stack.
 8. The method of claim 1, whereinthe abrasive nanoparticles include zirconium oxide, zirconium nitride ora combination thereof.
 9. The method of claim 1, further comprisingforming a first cut metal gate (CMG) in the dummy region and a secondCMG in the active device region, wherein the first and second CMGs aredifferent in composition; and thereafter performing another CMP processusing the slurry including the charged abrasive nanoparticles.
 10. Amethod, comprising: providing a semiconductor substrate; forming a firstmetal gate stack in a dummy region of the semiconductor substrate, thefirst metal gate stack including a first work function metal layer;forming a second metal gate stack in an active device region of thesemiconductor substrate, the second metal gate stack including a secondwork function metal layer different than the first work function metallayer; and performing a chemical mechanical polishing (CMP) processusing a slurry including a negatively charged abrasive nanoparticles,wherein the negatively charged abrasive nanoparticles includes a higherconcentration in the active device region than in the dummy regioncausing a faster removal rate in the active device region, and whereinafter the performing of the CMP process, the first metal gate stack hasa first height greater than a second height of the second metal gatestack.
 11. The method of claim 10, wherein each of the first and secondmetal gate stacks includes tungsten as a filling metal; the first workfunction metal layer of the first metal gate stack includes titaniumnitride with a first volume percentage; and the second work functionmetal layer of the second metal gate stack includes titanium nitridewith a second volume percentage greater than the first volumepercentage.
 12. The method of claim 11, wherein the first height of thefirst metal gate stack is greater than the second height of the secondmetal gate stack by a dimension ranging between 1 nm and 3 nm.
 13. Themethod of claim 10, wherein the negatively charged abrasivenanoparticles include zirconium oxide, zirconium nitride or acombination thereof.
 14. The method of claim 10, further comprisingforming a first cut metal gate (CMG) in the dummy region and a secondCMG in the active device region, wherein the first and second CMGs aredifferent in at least one of composition and pattern density; andthereafter performing another CMP process using the slurry including thenegatively charged abrasive nanoparticles.
 15. The method of claim 10,wherein the active device region is surrounded by the dummy region. 16.A method, comprising: providing a semiconductor substrate; forming afirst metal gate stack in a dummy region of the semiconductor substrateand a first second metal gate stack in an active device region of thesemiconductor substrate; forming first cut metal gates (CMGs) in thedummy region; forming second CMGs in the active device region, whereinthe second CMGs are different from the first CMGs in composition; andperforming a chemical mechanical polishing (CMP) process using a slurry,wherein after the performing of the CMP process, the first metal gatestack has a first height different from a second height of the secondmetal gate stack.
 17. The method of claim 16, wherein the first CMGs inthe dummy region includes silicon nitride (SiN) with a first patterndensity; the second CMGs in the active device region includes a secondpattern density less than the first pattern density; the slurry has afirst polish rate to SiN greater than a second polish rate to siliconoxide (SIO₂); and the first height is less than the second height. 18.The method of claim 16, wherein the first CMGs in the dummy regionincludes SiN with a first pattern density; the second CMGs in the activedevice region includes a second pattern density less than the firstpattern density; the slurry has a first polish rate to SiN less than asecond polish rate to SiO₂; and the first height is greater than thesecond height.
 19. The method of claim 16, wherein the first CMGs in thedummy region includes SiO₂ with a first pattern density; the second CMGsin the active device region includes a second pattern density less thanthe first pattern density; the slurry has a first polish rate to SiNgreater than a second polish rate to SIO₂; and the first height isgreater than the second height.
 20. The method of claim 16, wherein thefirst CMGs in the dummy region includes SiO₂ with a first patterndensity; the second CMGs in the active device region includes a secondpattern density less than the first pattern density; the slurry has afirst polish rate to SiN less than a second polish rate to SiO₂; and thefirst height is less than the second height.